RUN-TO-RUN CONTROL IN SEMICONDUCTOR MANUFACTURING by Hurwitz, A M, etc. ISBN 0849311780

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[edit] RUN-TO-RUN CONTROL IN SEMICONDUCTOR MANUFACTURING

This text identifies key components of implementing run-to-run (R2R) controls, with a methodology for implementing them for virtually any process. It illustrates the advantages of R2R control with manufacturing case studies.

Run-to-Run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine 'runs,' thereby minimizing process drift, shift, and variability and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run-to-Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.

[edit] Book Details

[edit] Title

RUN-TO-RUN CONTROL IN SEMICONDUCTOR MANUFACTURING

[edit] Author

Hurwitz, A M, etc.

[edit] ISBN

0849311780

[edit] Published

30/11/2000

[edit] Publisher

CRC Press Inc., U.S.

[edit] Binding

hardback

[edit] Retail Price

62.99 (GBP)

[edit] Typical Price Online

59.84 (GBP)

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ISBN 0849311780


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